DocumentCode
2572954
Title
A conductivity modulated high voltage polycrystalline silicon thin film transistor with improved on state and transient performance
Author
Xu, Y.Z. ; Clough, F.J. ; Narayanan, E.M.S. ; Chen, Y. ; Milne, W.I.
Author_Institution
Dept. of Electr. & Electron. Eng., De Montfort Univ., Leicester, UK
fYear
1998
fDate
6-9 Dec. 1998
Firstpage
273
Lastpage
276
Abstract
A novel high voltage polycrystalline silicon thin film transistor, with an improved on state and transient performance, is presented in this report. The key features of the new structure are the combination of a p/sup +/ drain and a semi-insulating field plate which connects the gate to the drain. Minority carrier injection from the p/sup +/ drain increases the on state current by a factor of 5 and reduces the ´turn on´ time by over 10%. The minority carrier injection effects decay over sub-microsecond time scales.
Keywords
elemental semiconductors; minority carriers; power field effect transistors; silicon; thin film transistors; Si; conductivity modulation; high voltage polycrystalline silicon thin film transistor; minority carrier injection; on state current; p/sup +/ drain; polysilicon HVTFT; semi-insulating field plate; transient characteristics; turn on time; Circuit testing; Conductivity; Fabrication; Glass; Inverters; Plasma temperature; Probes; Silicon; Thin film transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Print_ISBN
0-7803-4774-9
Type
conf
DOI
10.1109/IEDM.1998.746353
Filename
746353
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