• DocumentCode
    2572954
  • Title

    A conductivity modulated high voltage polycrystalline silicon thin film transistor with improved on state and transient performance

  • Author

    Xu, Y.Z. ; Clough, F.J. ; Narayanan, E.M.S. ; Chen, Y. ; Milne, W.I.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., De Montfort Univ., Leicester, UK
  • fYear
    1998
  • fDate
    6-9 Dec. 1998
  • Firstpage
    273
  • Lastpage
    276
  • Abstract
    A novel high voltage polycrystalline silicon thin film transistor, with an improved on state and transient performance, is presented in this report. The key features of the new structure are the combination of a p/sup +/ drain and a semi-insulating field plate which connects the gate to the drain. Minority carrier injection from the p/sup +/ drain increases the on state current by a factor of 5 and reduces the ´turn on´ time by over 10%. The minority carrier injection effects decay over sub-microsecond time scales.
  • Keywords
    elemental semiconductors; minority carriers; power field effect transistors; silicon; thin film transistors; Si; conductivity modulation; high voltage polycrystalline silicon thin film transistor; minority carrier injection; on state current; p/sup +/ drain; polysilicon HVTFT; semi-insulating field plate; transient characteristics; turn on time; Circuit testing; Conductivity; Fabrication; Glass; Inverters; Plasma temperature; Probes; Silicon; Thin film transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4774-9
  • Type

    conf

  • DOI
    10.1109/IEDM.1998.746353
  • Filename
    746353