• DocumentCode
    2573506
  • Title

    A new dynamic-threshold SOI device having an embedded resistor and a merged body-bias-control transistor

  • Author

    Horiuchi, M.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • fYear
    1998
  • fDate
    6-9 Dec. 1998
  • Firstpage
    419
  • Lastpage
    422
  • Abstract
    An embedded resistor just under the source junction and a small subsidiary body-bias-control transistor enables construction of a variable-threshold SOI-MOSFET with a small area penalty and without any limitation on the power-supply voltage. In the primary transistor, this resistor not only controls the body potential to increase the on-current and decrease the off-current under the AC condition, but also eliminates floating-body effects. The inverter delay time with and without a 1 pF load capacitance can be shortened to 55% and 40%, respectively, of that of a bulk device under 1 V operation.
  • Keywords
    CMOS integrated circuits; MOSFET; high-speed integrated circuits; low-power electronics; silicon-on-insulator; 1 V; AC condition; Si; dynamic-threshold SOI device; embedded resistor; floating-body effects elimination; inverter delay time; merged body-bias-control transistor; source junction; variable-threshold SOI-MOSFET; CMOSFETs; Capacitance; Circuits; Current supplies; Delay effects; Inverters; Laboratories; Resistors; Subthreshold current; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4774-9
  • Type

    conf

  • DOI
    10.1109/IEDM.1998.746388
  • Filename
    746388