Title : 
A new dynamic-threshold SOI device having an embedded resistor and a merged body-bias-control transistor
         
        
        
            Author_Institution : 
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
         
        
        
        
        
        
            Abstract : 
An embedded resistor just under the source junction and a small subsidiary body-bias-control transistor enables construction of a variable-threshold SOI-MOSFET with a small area penalty and without any limitation on the power-supply voltage. In the primary transistor, this resistor not only controls the body potential to increase the on-current and decrease the off-current under the AC condition, but also eliminates floating-body effects. The inverter delay time with and without a 1 pF load capacitance can be shortened to 55% and 40%, respectively, of that of a bulk device under 1 V operation.
         
        
            Keywords : 
CMOS integrated circuits; MOSFET; high-speed integrated circuits; low-power electronics; silicon-on-insulator; 1 V; AC condition; Si; dynamic-threshold SOI device; embedded resistor; floating-body effects elimination; inverter delay time; merged body-bias-control transistor; source junction; variable-threshold SOI-MOSFET; CMOSFETs; Capacitance; Circuits; Current supplies; Delay effects; Inverters; Laboratories; Resistors; Subthreshold current; Threshold voltage;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
         
        
            Conference_Location : 
San Francisco, CA, USA
         
        
        
            Print_ISBN : 
0-7803-4774-9
         
        
        
            DOI : 
10.1109/IEDM.1998.746388