DocumentCode :
2573506
Title :
A new dynamic-threshold SOI device having an embedded resistor and a merged body-bias-control transistor
Author :
Horiuchi, M.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear :
1998
fDate :
6-9 Dec. 1998
Firstpage :
419
Lastpage :
422
Abstract :
An embedded resistor just under the source junction and a small subsidiary body-bias-control transistor enables construction of a variable-threshold SOI-MOSFET with a small area penalty and without any limitation on the power-supply voltage. In the primary transistor, this resistor not only controls the body potential to increase the on-current and decrease the off-current under the AC condition, but also eliminates floating-body effects. The inverter delay time with and without a 1 pF load capacitance can be shortened to 55% and 40%, respectively, of that of a bulk device under 1 V operation.
Keywords :
CMOS integrated circuits; MOSFET; high-speed integrated circuits; low-power electronics; silicon-on-insulator; 1 V; AC condition; Si; dynamic-threshold SOI device; embedded resistor; floating-body effects elimination; inverter delay time; merged body-bias-control transistor; source junction; variable-threshold SOI-MOSFET; CMOSFETs; Capacitance; Circuits; Current supplies; Delay effects; Inverters; Laboratories; Resistors; Subthreshold current; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-4774-9
Type :
conf
DOI :
10.1109/IEDM.1998.746388
Filename :
746388
Link To Document :
بازگشت