Title : 
Arrays of resonant tunnelling diodes defined by in-situ focused ion beam lithography: potential millimetre wave/microwave power sources?
         
        
            Author : 
See, P. ; Steenson, D.P. ; Arnone, D.D. ; Linfield, E.H. ; Rose, P.D. ; Collins, C.E. ; Ritchie, D.A. ; Jones, G.A.C.
         
        
            Author_Institution : 
Cavendish Lab., Cambridge Univ., UK
         
        
        
        
        
        
            Abstract : 
The ability to fabricate and electrically contact an array of small, high current density resonant tunnelling diodes (RTDs) with a common bias connection has potential impact in realising solid state millimetre wave/microwave power sources. In this paper, a novel technique is proposed and demonstrated to form these arrays using a combination of in-situ focused ion beam lithography (FIB) with molecular beam epitaxy (MBE) regrowth. Room temperature DC I-V characteristics of the resulting planar devices are presented, together with preliminary s-parameter measurements and power emission spectra of individual FIB RTDs.
         
        
            Keywords : 
S-parameters; focused ion beam technology; ion beam lithography; microwave diodes; microwave generation; millimetre wave diodes; millimetre wave generation; molecular beam epitaxial growth; resonant tunnelling diodes; DC I-V characteristics; S-parameters; focused ion beam lithography; molecular beam epitaxy; planar device; power emission spectra; resonant tunnelling diode array; solid state microwave power source; solid state millimetre wave power source; Contacts; Current density; Diodes; Ion beams; Lithography; Microwave antenna arrays; Microwave devices; Molecular beam epitaxial growth; Resonant tunneling devices; Solid state circuits;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
         
        
            Conference_Location : 
San Francisco, CA, USA
         
        
        
            Print_ISBN : 
0-7803-4774-9
         
        
        
            DOI : 
10.1109/IEDM.1998.746391