Title :
Automatic capacitor evaluation and testing with characteristic graph
Author :
Szabó, Roland ; Gontean, Aurel ; Lie, Ioan
Author_Institution :
Appl. Electron. Dept., Politeh. Univ. of Timisoara, Timişoara, Romania
Abstract :
This paper presents an automatic testing method of capacitors. The used equipment is an Agilent 4263B LCR Meter. This equipment can measure, capacitance, resistance and inductance as a function of frequency. This way we can evaluate capacitors, because their value changes with the frequency.
Keywords :
capacitors; semiconductor device testing; Agilent 4263B LCR meter; automatic capacitor evaluation; automatic capacitor testing; capacitance measurement; characteristic graph; inductance measurement; resistance measurement; Capacitance; Capacitance measurement; Capacitors; Electrical resistance measurement; Frequency measurement; Resistance; Signal generators; acquisition; automation; capacitor evaluation; characteristic graph; testability;
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2012 IEEE 18th International Symposium for
Conference_Location :
Alba Iulia
Print_ISBN :
978-1-4673-4760-0
Electronic_ISBN :
INAVLID ISBN
DOI :
10.1109/SIITME.2012.6384394
