• DocumentCode
    2573654
  • Title

    Automatic capacitor evaluation and testing with characteristic graph

  • Author

    Szabó, Roland ; Gontean, Aurel ; Lie, Ioan

  • Author_Institution
    Appl. Electron. Dept., Politeh. Univ. of Timisoara, Timişoara, Romania
  • fYear
    2012
  • fDate
    25-28 Oct. 2012
  • Firstpage
    289
  • Lastpage
    293
  • Abstract
    This paper presents an automatic testing method of capacitors. The used equipment is an Agilent 4263B LCR Meter. This equipment can measure, capacitance, resistance and inductance as a function of frequency. This way we can evaluate capacitors, because their value changes with the frequency.
  • Keywords
    capacitors; semiconductor device testing; Agilent 4263B LCR meter; automatic capacitor evaluation; automatic capacitor testing; capacitance measurement; characteristic graph; inductance measurement; resistance measurement; Capacitance; Capacitance measurement; Capacitors; Electrical resistance measurement; Frequency measurement; Resistance; Signal generators; acquisition; automation; capacitor evaluation; characteristic graph; testability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2012 IEEE 18th International Symposium for
  • Conference_Location
    Alba Iulia
  • Print_ISBN
    978-1-4673-4760-0
  • Electronic_ISBN
    INAVLID ISBN
  • Type

    conf

  • DOI
    10.1109/SIITME.2012.6384394
  • Filename
    6384394
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2573654