DocumentCode :
25738
Title :
Design Criteria for InGaAs/InP Single-Photon Avalanche Diode
Author :
Acerbi, Fabio ; Anti, M. ; Tosi, Alberto ; Zappa, Franco
Author_Institution :
Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
Volume :
5
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
6800209
Lastpage :
6800209
Abstract :
We provide a detailed insight on the design of InGaAs/InP single-photon avalanche diode (SPAD) for 1.55- μm photon detection. In order to lower SPAD noise [the dark count rate (DCR)] without lowering photon detection efficiency (PDE) or increasing afterpulsing, it is important to optimize detector vertical layer structure and diffusion profiles. We present simulations of SPAD structures with different models, including custom ones. We discuss the influences of multiplication region thickness and doping, absorption region thickness, and electric-field distribution on SPAD performance. Multiplication region thickness strongly affects tunneling generation, whereas a thicker absorption region gives higher absorption efficiency but reduces trigger efficiency. Their optimal values depend on InP and InGaAs material quality and on device operating conditions. We show how electric field within InGaAs must be chosen as a tradeoff between heterobarrier transit efficiency and carrier generation.
Keywords :
III-V semiconductors; avalanche photodiodes; gallium arsenide; indium compounds; optical design techniques; semiconductor device models; semiconductor device noise; semiconductor doping; DCR; InGaAs-InP; PDE; SPAD; SPAD noise; absorption region thickness; carrier generation; dark count rate; doping; electric-field distribution; heterobarrier transit efficiency; multiplication region thickness; photon detection efficiency; single-photon avalanche diode design criteria; tunneling generation; Absorption; Detectors; Electric fields; Indium gallium arsenide; Indium phosphide; Photonics; Tunneling; Avalanche photodiodes; InGaAs; dark count; detection efficiency; performance simulation; photon counting; single-photon avalanche diode (SPAD);
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2013.2258664
Filename :
6504460
Link To Document :
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