Title :
High-performance electroplated solenoid-type integrated inductor (SI/sup 2/) for RF applications using simple 3D surface micromachining technology
Author :
Jun-Bo Yoon ; Bon-Kee Kim ; Chul-Hi Han ; Euisik Yoon ; Kwyro Lee ; Choong-Ki Kim
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Abstract :
Electroplated solenoid-type integrated inductors (SI/sup 2/s) have been demonstrated to have high performance and small area occupation for GHz applications, using a new, simple, and highly adaptable 3D surface micromachining technology. The method utilizes simply modified conventional photolithography and well-established electroplating at a low process temperature (<120/spl deg/C), so that the post-IC process and batch fabrication are possible. We have fabricated a 20-turn SI/sup 2/ with an inductance of 2.5nH, a peak Q-factor of 19 at 5.5 GHz, and the surface area occupation of 800 /spl mu/m by 90 /spl mu/m excluding pads (50 nH/mm/sup 2/), from the entirely unoptimized initial fabrication on a glass substrate. Also, a 10 nH and a peak Q of 12.5 at 2.3 GHz have been obtained from an 80-turn SI/sup 2/ (27 nH/mm/sup 2/).
Keywords :
Q-factor; electroplating; inductors; micromachining; photolithography; solenoids; 120 C; 2.3 GHz; 3D surface micromachining; 5.5 GHz; Q-factor; RF IC; batch fabrication; electroplating; inductance; photolithography; solenoid integrated inductor; surface area; Bridge circuits; Bridges; Conducting materials; Fabrication; Inductance; Inductors; Lithography; Radio frequency; Resists; Solenoids;
Conference_Titel :
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-4774-9
DOI :
10.1109/IEDM.1998.746417