Secondary Electron Emission from Niobium

Summary form only given. A novel ultra high vacuum secondary electron emission test stand supporting an electron gun, a charged particle position detector with controlling grid, and a cryostat assembly is used to conduct electron emission studies. The controlling grid aids in collecting the true secondary electrons. The particle position grid provides an incomplete picture of the final state of the secondary electron collected. With the aid of particle tracking codes, initial states of a family of secondary electrons leading to the final measured state are identified. A sample calculation will be presented and compared against results from a secondary electron emission Monte Carlo code originally developed by Dr. David Joy at the University of Tennessee and significantly modified at UNLV.