DocumentCode
2574807
Title
Atpg For Heat Dissipation Minimization During Scan Testing
Author
Wang, Seongmoon ; Gupta, Sandeep K.
Author_Institution
University of Southern California
fYear
1997
fDate
9-13 June 1997
Firstpage
614
Lastpage
619
Keywords
Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Minimization; Nondestructive testing; Permission; Sequential analysis; Sequential circuits; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location
Anaheim, CA, USA
ISSN
0738-100X
Print_ISBN
0-7803-4093-0
Type
conf
DOI
10.1109/DAC.1997.597219
Filename
597219
Link To Document