DocumentCode :
2575001
Title :
Automatic Generation Of Synchronous Test Patterns For Asynchronous Circuits
Author :
Roig, Oriol ; Cortadella, Jordi ; Peiia, M.A. ; Pastor, Enric
Author_Institution :
Department of Computer Architecture, Universitat Politkcnica de Catalunya. Barcelona, Spain.
fYear :
1997
fDate :
9-13 June 1997
Firstpage :
620
Lastpage :
625
Keywords :
Asynchronous circuits; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Delay; Design for testability; Permission; Synchronous generators; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
0-7803-4093-0
Type :
conf
DOI :
10.1109/DAC.1997.597220
Filename :
597220
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2575001
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