Title :
Microwave characteristics of planar electrooptic modulator
Author :
Delrue, R. ; Paleczny, E. ; Legier, J.F. ; Pribetich, P. ; Kennis, P.
Author_Institution :
Centre Hyperfrequences et Semiconducteurs, CNRS, Villeneuve d´´Ascq, France
Abstract :
An attempt is made to model traveling-wave optical modulators in the microwave frequency range by two methods: a desktop computer method based on the effective complex dielectric constant and a more rigorous method, i.e. the mode-matching technique. The aim is to quantify both bulk microwave and metallic losses and to determine the phase velocity in the microwave frequency range. This study takes into account the geometry of the cross section of the structure, the multilayered nature of the waveguide, and the hybrid nature of the mode. The two methods are compared for moderately lossy structures and shown to give quite similar results. However, when more realistic structures with highly doped multilayered substrates are considered, only the rigorous method can be used.<>
Keywords :
electro-optical devices; electronic engineering computing; losses; modelling; optical modulation; optical waveguide components; optical waveguide theory; permittivity; bulk microwave losses; desktop computer method; effective complex dielectric constant; highly doped multilayered substrates; lossy structures; metallic losses; microwave frequency range; mode-matching technique; model; optical waveguide structure; phase velocity; planar electrooptic modulator; structure cross-section geometry; traveling-wave optical modulators; Electrodes; Electrooptic modulators; High speed optical techniques; Microwave communication; Microwave devices; Microwave frequencies; Optical devices; Optical interferometry; Optical modulation; Optical waveguides;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38932
