Overall outage probability of two-way amplify-and-forward relaying in Nakagami-m fading channels

Author

Xu, Xiaoming ; Cai, Yueming ; Cai, Chunxiao ; Yang, Wendong

Author_Institution

Inst. of Commun. Eng., PLA Univ. of Sci. & Technol., Nanjing, China

fYear

2011

fDate

9-11 Nov. 2011

Firstpage

1

Lastpage

4

Abstract

Analytic ally studying the overall outage performance of two-way amplify-and-forward (AF) relaying systems has always been a difficult task. In this paper we study the overall outage probability (OOP) for the two-way amplify-and-forward (AF) relaying system. The channels are independent but not identically Nakagami-m fading distributed. We obtain the tight closed-form OOP approximated expression for the system. Our results indicate that the tight closed-form approximation can march the simulation perfectly in large signal-to-noise ratios (SNRs). The theoretical analysis can be further applied to study the two-way multiple-relay systems in Nakagami-m fading channels.

Keywords

amplify and forward communication; approximation theory; fading channels; probability; Nakagami-m fading channel; closed-form OOP approximated expression; overall outage probability; signal-to-noise ratio; two-way amplify-and-forward relaying; two-way multiple-relay system; Approximation methods; Bidirectional control; Rayleigh channels; Relays; Signal to noise ratio; Simulation; Overall outage probability; amplify-and-forward; two-way relaying;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless Communications and Signal Processing (WCSP), 2011 International Conference on

Conference_Location

Nanjing

Print_ISBN

978-1-4577-1009-4

Electronic_ISBN

978-1-4577-1008-7

Type

conf

DOI

10.1109/WCSP.2011.6096817

Filename

6096817