• DocumentCode
    2575698
  • Title

    Effect of Interfacial IMCs Proportion on the Reliability of Miniature Lead-Free Solder Joint

  • Author

    Wu, Fengshun ; He, Mingmin ; Wu, Yiping ; An, Bing ; Zhang, Weigang

  • Author_Institution
    State Key Lab. of Plastic Forming Simulation & Die & Mould Technol., Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The effect of interfacial IMCs (intermetallic compounds) proportion on the reliability of miniature lead-free solder joint was studied. The miniature lead free solder joint was formed with Sn-3.5Ag-0.5Cu or Sn-3.5Ag solder alloys and two copper bars that the ends were plated with Ni and Au. Several sizes of micro-joints were gotten to measure the effect of IMCs proportion. Optical microscope (OM) was used to observe the changes of interfacial IMCs of different miniature joints. Maximal shear strength force and maximal impact force were tested to evaluate the effect of miniaturization on the reliability. The results showed that the interfacial IMCs proportion of solder joints increased when they were aged at 150degC for 0 hours, 120 hours, and 200 hours or the sizes of solder joints changed from 100 mum to 20 mum. The maximal shear strength and maximal impact force of the solder joints decreased when the interfacial IMCs proportion increased
  • Keywords
    copper alloys; reliability; silver alloys; soldering; solders; tin alloys; 120 h; 150 C; 200 h; Au; Ni; SnAg; SnAgCu; interfacial IMC; intermetallic compound proportion; lead-free solder joint reliability; maximal impact force; maximal shear strength force; optical microscope; solder alloys; solder joint proportion; Bars; Copper alloys; Environmentally friendly manufacturing techniques; Gold alloys; Intermetallic; Lead; Nickel alloys; Optical microscopy; Size measurement; Soldering; interfacial IMCs; lead-free; miniaturization; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359754
  • Filename
    4198875