DocumentCode
2575698
Title
Effect of Interfacial IMCs Proportion on the Reliability of Miniature Lead-Free Solder Joint
Author
Wu, Fengshun ; He, Mingmin ; Wu, Yiping ; An, Bing ; Zhang, Weigang
Author_Institution
State Key Lab. of Plastic Forming Simulation & Die & Mould Technol., Huazhong Univ. of Sci. & Technol., Wuhan
fYear
2006
fDate
26-29 Aug. 2006
Firstpage
1
Lastpage
5
Abstract
The effect of interfacial IMCs (intermetallic compounds) proportion on the reliability of miniature lead-free solder joint was studied. The miniature lead free solder joint was formed with Sn-3.5Ag-0.5Cu or Sn-3.5Ag solder alloys and two copper bars that the ends were plated with Ni and Au. Several sizes of micro-joints were gotten to measure the effect of IMCs proportion. Optical microscope (OM) was used to observe the changes of interfacial IMCs of different miniature joints. Maximal shear strength force and maximal impact force were tested to evaluate the effect of miniaturization on the reliability. The results showed that the interfacial IMCs proportion of solder joints increased when they were aged at 150degC for 0 hours, 120 hours, and 200 hours or the sizes of solder joints changed from 100 mum to 20 mum. The maximal shear strength and maximal impact force of the solder joints decreased when the interfacial IMCs proportion increased
Keywords
copper alloys; reliability; silver alloys; soldering; solders; tin alloys; 120 h; 150 C; 200 h; Au; Ni; SnAg; SnAgCu; interfacial IMC; intermetallic compound proportion; lead-free solder joint reliability; maximal impact force; maximal shear strength force; optical microscope; solder alloys; solder joint proportion; Bars; Copper alloys; Environmentally friendly manufacturing techniques; Gold alloys; Intermetallic; Lead; Nickel alloys; Optical microscopy; Size measurement; Soldering; interfacial IMCs; lead-free; miniaturization; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0619-6
Electronic_ISBN
1-4244-0620-X
Type
conf
DOI
10.1109/ICEPT.2006.359754
Filename
4198875
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