DocumentCode :
2576011
Title :
A folded-channel MOSFET for deep-sub-tenth micron era
Author :
Hisamoto, D. ; Wen-Chin Lee ; Kedzierski, J. ; Anderson, E. ; Takeuchi, H. ; Asano, K. ; Tsu-Jae King ; Bokor, J. ; Chenming Hu
Author_Institution :
Central Res. Lab., Hitachi Ltd., Japan
fYear :
1998
fDate :
6-9 Dec. 1998
Firstpage :
1032
Lastpage :
1034
Abstract :
Deep-sub-tenth micron MOSFETs with gate length down to 20 nm are reported. To improve the short channel effect immunities, a novel folded channel transistor structure is proposed. The quasi-planar nature of this new variant of the vertical double-gate SOI MOSFETs simplified the fabrication process. The special features of the structure are: (1) a transistor is formed in a vertical ultra-thin Si fin and is controlled by a double-gate, which suppresses short channel effects; (2) the two gates are self-aligned and are aligned to the S/D; (3) S/D is raised to reduce the parasitic resistance; (4) new low-temperature gate or ultra-thin gate dielectric materials can be used because they are deposited after the S/D; and (5) the structure is quasi-planar because the Si fins are relatively short.
Keywords :
MOS integrated circuits; MOSFET; ULSI; dielectric thin films; silicon-on-insulator; 20 nm; deep-sub-tenth micron era; folded-channel MOSFET; low-temperature gate; parasitic resistance; quasi-planar nature; short channel effect immunities; ultra-thin gate dielectric materials; vertical ultra-thin fin; Dielectric materials; Electron devices; Etching; Fabrication; Immune system; Laboratories; Lithography; MOSFET circuits; Silicon germanium; Steel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-4774-9
Type :
conf
DOI :
10.1109/IEDM.1998.746531
Filename :
746531
Link To Document :
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