• DocumentCode
    2576064
  • Title

    Complex Low Volume Electronics Simulation Tool to Improve Yield and Reliability

  • Author

    Velandia, Diana M.Segura ; Conway, Paul P. ; West, Andrew A. ; Whalley, David ; Wilson, Antony ; Huertas, Lina

  • Author_Institution
    Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University, Leics, LE11 3TU, United Kingdom, Tel. +44 0519 227 677
  • fYear
    2007
  • fDate
    3-5 Oct. 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Assembly of Printed Circuit Boards (PCB) in low volumes and a high-mix requires a level of manual intervention during product manufacture, which leads to poor first time yield and increased production costs. Failures at the component-level and failures that stem from non-component causes (i.e. system-level), such as defects in design and manufacturing, can account for this poor yield. These factors have not been incorporated in prediction models due to the fact that system-failure causes are not driven by well-characterised deterministic processes. A simulation and analysis support tool being developed that is based on a suite of interacting modular components with well defined functionalities and interfaces is presented in this paper. The CLOVES (Complex Low Volume Electronics Simulation) tool enables the characterisation and dynamic simulation of complete design; manufacturing and business processes (throughout the entire product life cycle) in terms of their propensity to create defects that could cause product failure. Details of this system and how it is being developed to fulfill changing business needs is presented in this paper. Using historical data and knowledge of previous printed circuit assemblies (PCA) design specifications and manufacturing experiences, defect and yield results can be effectively stored and re-applied for future problem solving. For example, past PCA design specifications can be used at design stage to amend designs or define process options to optimise the product yield and service reliability.
  • Keywords
    Analytical models; Assembly; Circuit simulation; Costs; Manufacturing processes; Predictive models; Principal component analysis; Printed circuits; Production; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-1335-5
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2007.4417046
  • Filename
    4417046