DocumentCode
2576087
Title
Temperature variation effect on dynamic characteristics of GaAs avalanche photodiodes
Author
Ahmadi, V. ; Masudy-Panah, S.
Author_Institution
Dept. of Electr. Eng., Tarbiat Modares Univ., Tehran
Volume
2
fYear
2008
fDate
22-26 June 2008
Firstpage
178
Lastpage
181
Abstract
In this paper, for the first time, we investigate the effects of temperature variation on the dynamic characteristics of homojunction GaAs avalanche photodiodes (APDs) over a temperature range of 77 K to 300 K. It is shown that we have higher breakdown voltage and lower frequency bandwidth as the operating temperature increases. We also show that the effect of temperature variation on breakdown voltage reduces in very short multiplication region APDs. In other word for the thin APDs, unlike the thick APDs, the effect of temperature variation on breakdown voltage is negligible.
Keywords
III-V semiconductors; avalanche photodiodes; gallium arsenide; semiconductor device models; semiconductor junctions; APD; DSMT; GaAs; breakdown voltage; dead-space-multiplication theory; dynamic property; frequency bandwidth; homojunction avalanche photodiode; temperature 77 K to 300 K; Avalanche photodiodes; Bandwidth; Charge carrier processes; Electrons; Gallium arsenide; Ionization; Phonons; Scattering; Semiconductor device noise; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks, 2008. ICTON 2008. 10th Anniversary International Conference on
Conference_Location
Athens
Print_ISBN
978-1-4244-2625-6
Electronic_ISBN
978-1-4244-2626-3
Type
conf
DOI
10.1109/ICTON.2008.4598625
Filename
4598625
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