• DocumentCode
    2576087
  • Title

    Temperature variation effect on dynamic characteristics of GaAs avalanche photodiodes

  • Author

    Ahmadi, V. ; Masudy-Panah, S.

  • Author_Institution
    Dept. of Electr. Eng., Tarbiat Modares Univ., Tehran
  • Volume
    2
  • fYear
    2008
  • fDate
    22-26 June 2008
  • Firstpage
    178
  • Lastpage
    181
  • Abstract
    In this paper, for the first time, we investigate the effects of temperature variation on the dynamic characteristics of homojunction GaAs avalanche photodiodes (APDs) over a temperature range of 77 K to 300 K. It is shown that we have higher breakdown voltage and lower frequency bandwidth as the operating temperature increases. We also show that the effect of temperature variation on breakdown voltage reduces in very short multiplication region APDs. In other word for the thin APDs, unlike the thick APDs, the effect of temperature variation on breakdown voltage is negligible.
  • Keywords
    III-V semiconductors; avalanche photodiodes; gallium arsenide; semiconductor device models; semiconductor junctions; APD; DSMT; GaAs; breakdown voltage; dead-space-multiplication theory; dynamic property; frequency bandwidth; homojunction avalanche photodiode; temperature 77 K to 300 K; Avalanche photodiodes; Bandwidth; Charge carrier processes; Electrons; Gallium arsenide; Ionization; Phonons; Scattering; Semiconductor device noise; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transparent Optical Networks, 2008. ICTON 2008. 10th Anniversary International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-2625-6
  • Electronic_ISBN
    978-1-4244-2626-3
  • Type

    conf

  • DOI
    10.1109/ICTON.2008.4598625
  • Filename
    4598625