• DocumentCode
    2576138
  • Title

    Analysis of Dark Stain on Chip Surface of High-Power LED

  • Author

    Wu, Fan ; Wu, Yiping ; An, Bing ; Wu, Fengshun

  • Author_Institution
    State Key Lab. of Plastic Forming Simulation & Die & Mould Technol., Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In the process of aging or in service of some high power blue LEDs, dark stain may occur on the LED chip surface, which cast a shadow over the chip and thus led to the losing of luminous flux. In the degraded samples, it was found that firstly the dark stain was formed on the chip surface equably, and then the color of this stain gradually darken with time. In this paper, this kind of dark stain was detected and analyzed. The morphology of the dark stain and the elements contained in it were measured by scanning electron microscopy (SEM) and energy dispersive analysis by X-ray (EDAX), respectively. A large mount of oxygen and carbon were found in the black zones, which implied that some chemical reactions occurred on the interface. After we removed the black materials off the chip surface, the quantity of luminous flux evidently increased. The origin of oxygen and the possible reason of the dark stain were also discussed
  • Keywords
    X-ray chemical analysis; light emitting diodes; scanning electron microscopy; EDAX; SEM; chemical reactions; chip surface; dark stain analysis; energy dispersive analysis by X-ray; high-power LED; scanning electron microscopy; Aging; Degradation; Dispersion; Electrodes; Indium tin oxide; Laboratories; Light emitting diodes; Scanning electron microscopy; Surface morphology; Temperature; dark stain; failure analysis; light degradation; light emitting diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359785
  • Filename
    4198906