DocumentCode :
2576144
Title :
Test Database Analysis - Inferences from a Disposition Tree
Author :
Lee, Jia Keat ; Phon-Amnuaisuk, Somnuk ; Yong, Lee Hong ; Thum, Siew Beng ; Ho, Chin Kuan ; Chew, Huat Chin
Author_Institution :
Multimedia Univ., Cyberjaya
fYear :
2007
fDate :
3-5 Oct. 2007
Firstpage :
32
Lastpage :
36
Abstract :
Test program (TP) is designed to have a few properties including test coverage, test flow and test condition specification. At present, these properties are adjusted based on expert experiences and some statistical tools. Heavy reliance on experts´ opinions and gathered experiences on improving testing efficiency can be reduced if the structure of the test flow is well understood. This paper suggests a way to perform inferences in a very large and complex test database in order to assist test engineers to improve testing efficiency. The TP complexity can be reduced by incorporating (i) expert rules, (ii) test results, and (iii) heuristics to the database. We propose to perform inferences on constructed trees i.e. source tree and disposition tree (DispTree) by counting path frequency and to provide insights for test engineers to identify redundant and misplaced test in a test flow. The proposed approach is evaluated on a considerably huge and complex TP with up to a thousand tests for dual-core microchip.
Keywords :
automatic test software; database management systems; trees (mathematics); TP complexity; disposition tree; expert rules; test condition specification; test coverage; test database analysis; test flow; test program; test results; testing efficiency; Circuit faults; Circuit testing; Complexity theory; Costs; Data analysis; Data engineering; Frequency; Multimedia databases; Performance evaluation; Reliability engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
Conference_Location :
San Jose, CA
ISSN :
1089-8190
Print_ISBN :
978-1-4244-1335-5
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2007.4417052
Filename :
4417052
Link To Document :
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