• DocumentCode
    2576168
  • Title

    Cycle life status of SAFT VOS nickel-cadmium cells

  • Author

    Goualard, Jacques ; Boscher, Jacques

  • Author_Institution
    SAFT, Romainville, France
  • fYear
    1989
  • fDate
    6-11 Aug 1989
  • Firstpage
    1453
  • Abstract
    A summary of nickel-cadmium VOS cell tests is presented. The main results demonstrate that this cell could be operated at high depth of discharge (DOD), 80% in geosynchronous and 40% in low Earth orbit. In-flight data from satellites operating at DOD higher than 50% for five to 10 years are presented. A cell failure rate is determined and life expectancy curves are proposed
  • Keywords
    cadmium; nickel; secondary cells; space vehicle power plants; Ni-Cd cells; SAFT VOS Ni-Cd cells; cell failure rate; cell tests; geosynchronous orbit; high depth of discharge; life expectancy curves; low Earth orbit; Aerospace testing; Batteries; Electrodes; Life estimation; Life testing; Low earth orbit satellites; Performance evaluation; Temperature; US Department of Defense; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference, 1989. IECEC-89., Proceedings of the 24th Intersociety
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/IECEC.1989.74660
  • Filename
    74660