DocumentCode :
2576287
Title :
Compact Soft X-ray Lasers for Imaging, Material Processing, and Characterization at the Nanoscale
Author :
Rocca, J.J. ; Marconi, M.C. ; Menoni, C.S. ; Wachulak, P.W. ; Luther, B. ; Brizuela, F. ; Brewer, C. ; Wang, Y. ; Alessi, D. ; Berrill, M. ; Martz, D. ; Heinbuch, S. ; Grisham, M. ; Chao, W. ; Anderson, E.H. ; Attwood, D.T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO
fYear :
2007
fDate :
3-5 Oct. 2007
Firstpage :
101
Lastpage :
102
Abstract :
We have developed compact laser-pumped and discharge-pumped lasers operating at wavelengths of lambda=13.2 nm and lambda=46.9 nm respectively, and have used them in the demonstration of nanoscale full field imaging, nanopatterning, and nanoscale laser ablation. Using these new compact short wavelength lasers we have built two microscopes, using lambda=46.9 nm or lambda=13.2 nm laser illumination. The compact lambda=46.9 nm microscope condenses the light using a multilayer coated Schwarzschild mirror, and images the test object using a diffractive zone plate lens. By rearranging the optics, the lambda=46.9 nm microscope can also image surfaces. We have recently added the capability to spectroscopically analyze the light emitted from the plasma created during the ablation, opening the possibility to develop analytic nanoprobes. All of these results illustrate the capabilities of compact short wavelength lasers for nanotechnology applications.
Keywords :
X-ray lasers; laser ablation; measurement by laser beam; nanopatterning; optical images; analytic nanoprobes; diffractive zone plate lens; discharge-pumped lasers; laser illumination; laser imaging; laser material processing; laser-pumped lasers; multilayer coated Schwarzschild mirror; nanopatterning; nanoscale characterization; nanoscale full field imaging; nanoscale laser ablation; nanotechnology; short wavelength lasers; soft X-ray lasers; wavelength 13.2 nm; wavelength 46.9 nm; Laser ablation; Lighting; Materials processing; Microscopy; Nanopatterning; Nonhomogeneous media; Optical imaging; Surface emitting lasers; X-ray imaging; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
Conference_Location :
San Jose, CA
ISSN :
1089-8190
Print_ISBN :
978-1-4244-1335-5
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2007.4417060
Filename :
4417060
Link To Document :
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