• DocumentCode
    2576304
  • Title

    Parametric frequency domain identification of a time-varying system as a time-dependent weighted sum of time-invariant systems

  • Author

    Lataire, John ; Pintelon, Rik

  • Author_Institution
    Dept. ELEC, Fundamental Electr. & Instrum., Vrije Univ. Brussel, Brussels, Belgium
  • fYear
    2010
  • fDate
    15-17 Dec. 2010
  • Firstpage
    2029
  • Lastpage
    2034
  • Abstract
    A frequency domain, parametric identification procedure for single-input, single output time-varying systems is presented. The output of the model is built as a time-varying weighted sum of the responses of linear time-invariant systems. A judicious choice of the weighting functions is shown to provide an intuitive insight into the evolution of the instantaneous transfer function with time. Results of previous work are used to obtain non-parametric initial estimates of both the time-varying dynamics and the disturbing noise characteristics from the response of the system to a multisine excitation. The maximum likelihood estimator is set up and a minimization algorithm is developed. The estimator is applied to a simulation example and a measurement example (electronic circuit) which approximates the model assumptions.
  • Keywords
    frequency-domain synthesis; linear systems; maximum likelihood estimation; minimisation; time-varying systems; electronic circuit; instantaneous transfer function; linear time-invariant system; maximum likelihood estimator; minimization algorithm; multisine excitation; parametric frequency domain identification; parametric identification procedure; single-input single output time-varying system; time-dependent weighted sum; time-varying dynamics; time-varying weighted sum; Mathematical model; Noise; Polynomials; Time frequency analysis; Time varying systems; frequency domain; multisine excitation; system identification; time-varying systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control (CDC), 2010 49th IEEE Conference on
  • Conference_Location
    Atlanta, GA
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-4244-7745-6
  • Type

    conf

  • DOI
    10.1109/CDC.2010.5717679
  • Filename
    5717679