DocumentCode :
2576616
Title :
Wafer Level Hermetic Packaging of MOEMS Devices
Author :
Yang, Charles ; Xu, Antai ; Wang, Ye
Author_Institution :
Miradia Inc., Sunnyvale, CA
fYear :
2007
fDate :
3-5 Oct. 2007
Firstpage :
294
Lastpage :
297
Abstract :
Hermetic packaging is required for most of MEMS devices especially for micro-opto-electro-mechanical systems (MOEMS) devices with billions physical contacts. Chip-level hermetic packaging is a complex and costly process which counts for over 50% of device cost and does not scale. Wafer level packaging (WLP) provides a scalable path to cost down and is becoming a mainstream MEMS packaging method. In this paper, a hermetic wafer level packaging method using combination of anodic and glass frit bonding for MOEMS device is reported. The micro mirror structure is made of all silicon and is fabricated atop of a CMOS substrate. The WLP method includes a bonding of a transparent substrate to a silicon interposer substrate using anodic bonding. The assembly is subsequently bonded to a released CMOS-MEMS substrate using a low-temperature (<400degC glass frit material. The development work involves fine tuning and optimizing WLP processes to achieve high yield of hermetically sealing large die size on large wafer size (8"). In summary, the presented WLP scheme provides a robust and low-cost manufacturing method for packaging monolithically integrated CMOS-MEMS micro mirror devices.
Keywords :
CMOS integrated circuits; chip scale packaging; micro-optomechanical devices; micromirrors; silicon; wafer level packaging; CMOS substrate; MOEMS device; Si; anodic bonding; anodic frit bonding; chip-level hermetic packaging; glass frit bonding; interposer substrate; micro mirror structure; microopto-electro-mechanical system; wafer level hermetic packaging; Assembly; Chip scale packaging; Costs; Glass; Microelectromechanical devices; Micromechanical devices; Mirrors; Silicon; Wafer bonding; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
Conference_Location :
San Jose, CA
ISSN :
1089-8190
Print_ISBN :
978-1-4244-1335-5
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2007.4417080
Filename :
4417080
Link To Document :
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