• DocumentCode
    2576616
  • Title

    Wafer Level Hermetic Packaging of MOEMS Devices

  • Author

    Yang, Charles ; Xu, Antai ; Wang, Ye

  • Author_Institution
    Miradia Inc., Sunnyvale, CA
  • fYear
    2007
  • fDate
    3-5 Oct. 2007
  • Firstpage
    294
  • Lastpage
    297
  • Abstract
    Hermetic packaging is required for most of MEMS devices especially for micro-opto-electro-mechanical systems (MOEMS) devices with billions physical contacts. Chip-level hermetic packaging is a complex and costly process which counts for over 50% of device cost and does not scale. Wafer level packaging (WLP) provides a scalable path to cost down and is becoming a mainstream MEMS packaging method. In this paper, a hermetic wafer level packaging method using combination of anodic and glass frit bonding for MOEMS device is reported. The micro mirror structure is made of all silicon and is fabricated atop of a CMOS substrate. The WLP method includes a bonding of a transparent substrate to a silicon interposer substrate using anodic bonding. The assembly is subsequently bonded to a released CMOS-MEMS substrate using a low-temperature (<400degC glass frit material. The development work involves fine tuning and optimizing WLP processes to achieve high yield of hermetically sealing large die size on large wafer size (8"). In summary, the presented WLP scheme provides a robust and low-cost manufacturing method for packaging monolithically integrated CMOS-MEMS micro mirror devices.
  • Keywords
    CMOS integrated circuits; chip scale packaging; micro-optomechanical devices; micromirrors; silicon; wafer level packaging; CMOS substrate; MOEMS device; Si; anodic bonding; anodic frit bonding; chip-level hermetic packaging; glass frit bonding; interposer substrate; micro mirror structure; microopto-electro-mechanical system; wafer level hermetic packaging; Assembly; Chip scale packaging; Costs; Glass; Microelectromechanical devices; Micromechanical devices; Mirrors; Silicon; Wafer bonding; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
  • Conference_Location
    San Jose, CA
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-1335-5
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2007.4417080
  • Filename
    4417080