Title :
Vector measurements of microwave devices at cryogenic temperatures
Author :
Smuk, J.W. ; Stubbs, M.G. ; Wight, J.S.
Author_Institution :
Commun. Res. Centre, Ottawa, Ont., Canada
Abstract :
A real-time method to de-embed S-parameter measurements of MIC (microwave integrated circuit) devices operated at 77 K is presented. An apparatus to immerse the devices into liquid nitrogen and microstrip jigs that survive the extreme temperature drop were constructed in order to apply the through-reflect-line calibration technique to measurements over a frequency band from 2.5 GHz to 20 GHz. Measurements of both an interdigitated capacitor and a GaAs MESFET cooled in the liquid nitrogen bath are shown for these frequencies.<>
Keywords :
S-parameters; cryogenics; microwave integrated circuits; microwave measurement; 25 GHz to 20 GHz; 77 K; GaAs; MESFET; MIC; S-parameter measurements; cryogenic temperatures; interdigitated capacitor; liquid nitrogen; microstrip jigs; microwave devices; through-reflect-line calibration technique; Cryogenics; Frequency measurement; Integrated circuit measurements; Microstrip; Microwave devices; Microwave integrated circuits; Microwave measurements; Microwave theory and techniques; Nitrogen; Temperature;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38938
