Title :
An efficient image pattern recognition system using an evolutionary search strategy
Author :
Guo, Pei-Fang ; Bhattacharya, Prabir ; Kharma, Nawwaf
Abstract :
A mechanism involving evolutionary genetic programming (GP) and the expectation maximization algorithm (EM) is proposed to generate feature functions automatically, based on the primitive features, for an image pattern recognition system on the diagnosis of the disease OPMD. Prior to the feature function generation, we introduce a novel technique of the primitive texture feature extraction, which deals with non-uniform images, from the histogram region of interest by thresholds (HROIT). Compared with the performance achieved by support vector machine (SVM) using the whole primitive texture features, the GP-EM methodology, as a whole, achieves a better performance of 90.20% recognition rate on diagnosis, while projecting the hyperspace of the primitive features onto the space of a single generated feature.
Keywords :
Gaussian processes; diseases; expectation-maximisation algorithm; eye; feature extraction; genetic algorithms; image recognition; image segmentation; image texture; medical image processing; muscle; search problems; EM; GP; Gaussian mixture estimation; HROIT; OPMD disease diagnosis; efficiency 90.20 percent; evolutionary genetic programming; evolutionary search strategy; expectation maximization algorithm; feature function generation; histogram region; image pattern recognition system; image thresholding; oculopharyngeal muscular dystrophy; primitive texture feature extraction; support vector machine; Condition monitoring; Diseases; Feature extraction; Genetic programming; Histograms; Image databases; Image texture analysis; Pattern recognition; Shape; Support vector machines; Gaussian mixture estimation; evolutionary computation; feature generation; genetic programming; image processing; moments; pattern recognition; texture analysis; the expectation maximization algorithm;
Conference_Titel :
Systems, Man and Cybernetics, 2009. SMC 2009. IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-2793-2
Electronic_ISBN :
1062-922X
DOI :
10.1109/ICSMC.2009.5346614