DocumentCode
2576937
Title
Selective Induction Heating for Microsystem Packaging
Author
Chen, Mingxiang ; Liu, Sheng ; Gan, Zhiyin
Author_Institution
Inst. of Microsyst., Huazhong Univ. Sci. & Technol., Wuhan
fYear
2006
fDate
26-29 Aug. 2006
Firstpage
1
Lastpage
4
Abstract
Preliminary research on selective induction heating to achieve wafer bonding is presented in this paper. Some effects of bonding layer materials, coil design and impedance matching on induction heating are discussed. By choosing a suitable frequency of high frequency power supply and optimizing the induction coil, selective induction heating for wafer bonding has been achieved. Induction heating patterns in terms of bonding layer should be in closed loop, which is also effective for hermetic packaging, while other open-loop-patterns such as circuits, pads, et al., cannot be effectively heated because no eddy current or little eddy current can be inducted and are kept to be at low temperature, there damages on some temperature-sensitive devices can be avoided. The new technique can be applied to various IC and MEMS packaging such as eutectic bonding, solder bonding, and diffusion bonding
Keywords
eddy currents; impedance matching; induction heating; integrated circuit packaging; micromechanical devices; wafer bonding; IC packaging; MEMS packaging; bonding layer materials; coil design; diffusion bonding; eddy current; eutectic bonding; hermetic packaging; high frequency power supply; impedance matching; microsystem packaging; optimized induction coil; selective induction heating; solder bonding; temperature-sensitive devices; wafer bonding; Circuits; Coils; Diffusion bonding; Eddy currents; Frequency; Impedance matching; Packaging; Power supplies; Temperature; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0619-6
Electronic_ISBN
1-4244-0620-X
Type
conf
DOI
10.1109/ICEPT.2006.359830
Filename
4198951
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