Title :
A new W-band coplanar waveguide test fixture
Author :
Bellantoni, J.V. ; Compton, R.C. ; Levy, H.M.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
A coplanar waveguide (CPW) test fixture suitable for transistor measurements in the 75-110 GHz band is presented. The test fixture provides good RF characteristics and can be integrated monolithically with a GaAs device. The fixture uses finline tapers for the transition from waveguide the CPW, and air bridges to tie the opposing ground planes to the same potential. A simple computer model has been developed to aid in the design of the waveguide-to-CPW transitions. A prototype fabricated on low-dielectric-constant substrate has 4-dB loss from 85-95 GHz.<>
Keywords :
fin lines; microwave measurement; semiconductor device testing; solid-state microwave devices; 4 dB; 75 to 110 GHz; RF characteristics; W-band coplanar waveguide test fixture; air bridges; computer model; coplanar waveguide; finline tapers; ground planes; low-dielectric-constant substrate; transistor measurements; Bridges; Coplanar waveguides; Finline; Fixtures; Gallium arsenide; Planar waveguides; Prototypes; Radio frequency; Testing; Waveguide transitions;
Conference_Titel :
Microwave Symposium Digest, 1989., IEEE MTT-S International
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/MWSYM.1989.38940
