Title :
[Three invited talks]
Author :
Nanya, T. ; Chakrabarty, Krishnendu ; Takeuchi, Ken
Abstract :
These tutorials discuss the following: Toward Dependability of Information Society; Test and DfT as Enablers for Dependable 3D Integrated Circuits; Highly Reliable Signal Processing Technologies for Dependable Solid-State Drives (SSDs).
Keywords :
design for testability; integrated circuit testing; security of data; signal processing; three-dimensional integrated circuits; DfT; SSD; dependable 3D integrated circuit testing; dependable solid-state drives; design-for-testability; information society dependability; signal processing technology;
Conference_Titel :
Dependable Computing (PRDC), 2012 IEEE 18th Pacific Rim International Symposium on
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4849-2
Electronic_ISBN :
978-0-7695-4885-2
DOI :
10.1109/PRDC.2012.27
