Title :
Kinetics of X-ray luminescence. Accumulation light sum on traps
Author_Institution :
Kyiv Nat. Taras Shevchenko Univ., Kiev, Ukraine
Abstract :
Dependences accumulation of charge carriers on traps are obtained for kinetic theory of X-ray luminescence and conductivity. Integral characteristics: depending on the luminescent intensity of the excitation intensity, lux-ampere and current-voltage dependence should be linear with X-ray excitation.
Keywords :
X-ray absorption; electrical conductivity; electron traps; phosphorescence; wide band gap semiconductors; X-ray absorption; X-ray excitation intensity; X-ray luminescence kinetic theory; accumulation dependence; charge carriers; current-voltage dependence; electrical conductivity; electron traps; luminescent intensity; lux-ampere dependence; phosphorescence; wide gap semiconductors; Absorption; Correlation; Electron traps; Kinetic theory; Luminescence; X-ray conductivity; X-ray luminescence; kinetic theory; wide-gap semiconductors and dielectrics;
Conference_Titel :
Oxide Materials for Electronic Engineering (OMEE), 2014 IEEE International Conference on
Conference_Location :
Lviv
Print_ISBN :
978-1-4799-5960-0
DOI :
10.1109/OMEE.2014.6912330
