• DocumentCode
    2577453
  • Title

    ESD Models and Measurement for Semiconductor Device

  • Author

    Guo, Zhijun ; Tu, Xinya ; Pan, Jiangen ; Lu, Fei

  • Author_Institution
    Everfine Photo-E-Info Co. Ltd., Hangzhou
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Along with the development of technology, semiconductor devices, such as IC and LED, have got wide applications in electronic industry. Semiconductor devices are ESD sensitive. ESD would sometimes cause breakdown and destroy the devices. ESD can also cause indiscoverable soft breakdown that is a hidden trouble and would affect the quality, usage life, reliability of the products and even the profit of company. Many manufacturers have paid dearly for that. Thereby ESD is also comparable to a `cryptomorphic killer´ in electronic industry. This paper introduces the mechanism, types, discharge models of ESD, experimental methods for ESD recommended by international standards and basic principles of ESD test instruments. It focuses on the ESD test methods and test systems for IC, LED and other semiconductor devices
  • Keywords
    electronics industry; electrostatic discharge; semiconductor device breakdown; semiconductor device measurement; semiconductor device models; ESD models; discharge model; electronic industry; electrostatic discharge; semiconductor device; soft breakdown; Application specific integrated circuits; Electric breakdown; Electronics industry; Electrostatic discharge; Integrated circuit testing; Light emitting diodes; Semiconductor device measurement; Semiconductor device testing; Semiconductor devices; System testing; Electrostatic discharge; IC; LED; discharge model; semiconductor device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359859
  • Filename
    4198980