Title :
ESD Models and Measurement for Semiconductor Device
Author :
Guo, Zhijun ; Tu, Xinya ; Pan, Jiangen ; Lu, Fei
Author_Institution :
Everfine Photo-E-Info Co. Ltd., Hangzhou
Abstract :
Along with the development of technology, semiconductor devices, such as IC and LED, have got wide applications in electronic industry. Semiconductor devices are ESD sensitive. ESD would sometimes cause breakdown and destroy the devices. ESD can also cause indiscoverable soft breakdown that is a hidden trouble and would affect the quality, usage life, reliability of the products and even the profit of company. Many manufacturers have paid dearly for that. Thereby ESD is also comparable to a `cryptomorphic killer´ in electronic industry. This paper introduces the mechanism, types, discharge models of ESD, experimental methods for ESD recommended by international standards and basic principles of ESD test instruments. It focuses on the ESD test methods and test systems for IC, LED and other semiconductor devices
Keywords :
electronics industry; electrostatic discharge; semiconductor device breakdown; semiconductor device measurement; semiconductor device models; ESD models; discharge model; electronic industry; electrostatic discharge; semiconductor device; soft breakdown; Application specific integrated circuits; Electric breakdown; Electronics industry; Electrostatic discharge; Integrated circuit testing; Light emitting diodes; Semiconductor device measurement; Semiconductor device testing; Semiconductor devices; System testing; Electrostatic discharge; IC; LED; discharge model; semiconductor device;
Conference_Titel :
Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0619-6
Electronic_ISBN :
1-4244-0620-X
DOI :
10.1109/ICEPT.2006.359859