DocumentCode
2577461
Title
Nanoscale variable resistance using interlayer sliding of multiwall nanotube
Author
Akita, S. ; Nakayama, Y.
Author_Institution
Dept. of Phys. & Electron., Osaka Prefecture Univ., Sakai, Japan
fYear
2003
fDate
29-31 Oct. 2003
Firstpage
74
Lastpage
75
Abstract
In this paper, we explore an open subject of the interlayer electrical conduction in multiwall carbon nanotubes as a function of overlapping length in terms of the development of the nanoscale displacement sensors.
Keywords
carbon nanotubes; displacement measurement; electric breakdown; electric resistance; electric sensing devices; electrical conductivity; electrical contacts; C; interlayer electrical conduction; interlayer sliding; multiwall carbon nanotubes; nanoscale displacement sensors; nanoscale variable resistance; overlapping length; Breakdown voltage; Carbon nanotubes; Electric breakdown; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electrodes; Force measurement; Scanning electron microscopy; Sensor systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
Conference_Location
Tokyo, Japan
Print_ISBN
4-89114-040-2
Type
conf
DOI
10.1109/IMNC.2003.1268525
Filename
1268525
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