Title :
A micro-channel heat sink with integrated temperature sensors for phase transition study
Author :
Linan Jiang ; Man Wong ; Zohar, Y.
Author_Institution :
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
Abstract :
A unique technique of maskless and self-aligned Si etch between bonded wafers was developed and applied to fabricate a micro-channel heat sink integrated with a heater and an array of temperature sensors. The technique allowed the formation of self-aligned and self-stopped etching of grooves between the bonded wafers. The device, consisting of distributed sensors, allowed direct temperature measurements to evaluate local heat transfer rates under forced convection boiling conditions. Temperature distributions along the heat sink were measured for different levels of power dissipation. The onset of critical heat flux condition was investigated as a function of channel size and liquid flow rate. The results suggest that the bubble dynamic mechanism in micro-channels maybe different from that with conventional channels.
Keywords :
boiling; bubbles; channel flow; distributed sensors; etching; flowmeters; forced convection; heat sinks; microfluidics; micromachining; microsensors; temperature distribution; temperature sensors; Si; bonded wafers; bubble dynamic mechanism; channel size; critical heat flux condition; direct temperature measurements; distributed sensors; forced convection boiling; heater integrated; integrated temperature sensors; liquid flow rate; local heat transfer rates; maskless self-aligned etch; microchannel heat sink; phase transition study; power dissipation; self-stopped etching of grooves; temperature distributions; temperature microsensors; Etching; Heat sinks; Heat transfer; Power measurement; Sensor arrays; Temperature distribution; Temperature measurement; Temperature sensors; Thermal sensors; Wafer bonding;
Conference_Titel :
Micro Electro Mechanical Systems, 1999. MEMS '99. Twelfth IEEE International Conference on
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5194-0
DOI :
10.1109/MEMSYS.1999.746795