• DocumentCode
    2577984
  • Title

    Synthesis and Application of Novel Lead-Free Solders Derived from Sn-based Nanopowders

  • Author

    Li-Yin Hsiao ; Guo-Jyun Chiou ; Jenq-Gong Duh ; Tsai, Su-Yueh

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Two kinds of lead-free solders derived from tin-based nanopowders were fabricated. One was the lead-free solders with Sn-Ag-Cu nanopowders, and the other was nano-sized Cu6Sn5 doped Sn-Ag-Cu solders. The lead-free solders with Sn-Ag-Cu nanopowders were synthesized by chemical precipitation with NaBH4. The isolated particle exhibited a near spherical shape with particle sizes around 5 nm. The primary particle size of Sn-Ag-Cu nanopowders was in the range of 40 nm. Microstructural characteristics of particle growth were evaluated by TEM and FE-SEM. The primary particles after precipitation were (Ag,Cu)4Sn with a size of 4.9 nm. It was also revealed that (Ag,Cu)4Sn transformed into (Ag,Cu)3 Sn, when the total amount of Sn contributed from both (Ag,Cu)4Sn and Sn covering the (Ag,Cu)4Sn overtook that of (Ag,Cu)3Sn. The nano-sized Cu6Sn5 doped Sn-Ag-Cu solder paste was produced by mixing Cu6Sn5 nanopowder into commercial SnAg solder paste. To realize the effect of Cu6Sn5 nanopowder doping, the ball shear strength of the joint was further investigated. The fracture behavior of Sn-Ag-Cu solder joints was probed with respect to the fracture surfaces, interfacial morphologies, and ball shear strength. It was demonstrated that the creep strain rate sensitivity of nano- Cu6Sn5 doped composite solder was higher than that of commercial Sn-Ag-Cu solder, although the creep hardness of both solders was nearly identical
  • Keywords
    copper alloys; copper compounds; nanoparticles; precipitation; scanning electron microscopy; shear strength; silver alloys; sodium compounds; solders; tin; tin alloys; transmission electron microscopy; (AgCu)3Sn; (AgCu)4Sn; 4.9 nm; 40 nm; Cu6Sn5; FE-SEM; NaBH4; Sn; Sn-Ag-Cu; SnAg; TEM; ball shear strength; chemical precipitation; fracture surfaces; interfacial morphologies; lead-free solders; nanopowders; solder paste; Chemicals; Creep; Doping; Environmentally friendly manufacturing techniques; Lead; Nanoparticles; Shape; Soldering; Surface cracks; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359652
  • Filename
    4199010