DocumentCode :
2578432
Title :
InGaN light-emitting diodes with the strained AlGaN/InGaN multiple quantum barriers
Author :
Tsai, Chia-Lung ; Liu, Guan-Shan ; Lin, Jia-Qing ; Tseng, Hung-Wei ; Wang, Chien-Yu
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Taoyuan, Taiwan
fYear :
2009
fDate :
2-5 June 2009
Firstpage :
115
Lastpage :
117
Abstract :
In this article, we propose to use the strained Al0.03Ga0.97N/In0.01Ga0.99N superlattice as the quantum barrier of the InGaN LEDs. The advantage of doing this could be thought of relieving the biaxial strain for the normal InGaN/AlGaN MQWs, and improving the crystalline quality. Experimentally, high-resolution X-ray diffraction (HRXRD) was used to clarify the structural properties of the as-grown samples. As a result, the crystalline quality of the proposed LEDs does not degrade even incorporated an AlGaN into the barrier layer. For the LEDs with a strained-layer superlattice (SLS) quantum barrier, the observed PL intensity at 300 K becomes intense together with a blue shift of the emission peak that may be attributed to the alleviation of quantum-confined Stark effect (QCSE) as evaluated from the biased PL analysis.
Keywords :
X-ray diffraction; aluminium compounds; gallium compounds; indium compounds; light emitting diodes; photoluminescence; quantum confined Stark effect; semiconductor superlattices; spectral line shift; Al0.03Ga0.97N-In0.01Ga0.99N; blue shift; high-resolution X-ray diffraction; light-emitting diodes; multiple quantum barriers; quantum-confined Stark effect; strained-layer superlattice; Aluminum gallium nitride; Capacitive sensors; Crystallization; Degradation; Laser sintering; Light emitting diodes; Quantum well devices; Stark effect; Superlattices; X-ray diffraction; InGaN; Light emitting diodes (LEDs); QCSE; Quantum barriers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2009. NMDC '09. IEEE
Conference_Location :
Traverse City, MI
Print_ISBN :
978-1-4244-4695-7
Electronic_ISBN :
978-1-4244-4696-4
Type :
conf
DOI :
10.1109/NMDC.2009.5167537
Filename :
5167537
Link To Document :
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