• DocumentCode
    2578664
  • Title

    Surface micromachined multi-layer moving gate field effect transistor (MOGFET) pressure switch with integrated vacuum sealed cavity

  • Author

    Kang, J.W. ; Simonette, K.

  • Author_Institution
    Solid State Electron. Center, Honeywell Inc., Plymouth, MN, USA
  • fYear
    1999
  • fDate
    21-21 Jan. 1999
  • Firstpage
    499
  • Lastpage
    504
  • Abstract
    A microelectromechanical pressure switch with electronic switching using a moving gate field effect transistor (MOGFET) has been designed and fabricated. The MOGFET is designed to replace the metal to metal contact switches which are susceptible to arcing, micro-welding, and deformation of the contacts. Sufficient pressure hysteresis is achieved by the electrostatic force between the moving gate and the substrate. The threshold pressures and the pressure hysteresis are adjustable electrically. The spring-capacitor model is presented to explain pull-in and pull-out conditions which are critical for stable switching operations. A vacuum cavity is formed during fabrication process and provides the reference vacuum pressure without an extra vacuum package. The fabricated devices have various switching pressure ranges from 12 psia to 500 psia. The measured switching channel resistance values are approximately 11.8 K/spl Omega/ for a channel W/L ratio of 21 and 2.4 K/spl Omega/ for a W/L ratio of 51 at the gate voltage of 12 V.
  • Keywords
    field effect transistor switches; micromachining; micromechanical devices; MOGFET; electronic switching; microelectromechanical pressure switch; multilayer moving gate field effect transistor; spring capacitor model; surface micromachining; vacuum sealed cavity; Contacts; Costs; Electrostatics; FETs; Hysteresis; Monitoring; Silicon; Switches; Threshold voltage; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1999. MEMS '99. Twelfth IEEE International Conference on
  • Conference_Location
    Orlando, FL, USA
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-5194-0
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1999.746879
  • Filename
    746879