Author :
Kim, K.N. ; Lee, J.Y. ; Lee, K.H. ; Nob ; Nam, S.W. ; Park, Y.S. ; Kim, Y.H. ; Kim, H.S. ; Kim, J.S. ; Park, J.K. ; Lee, K.P. ; Lee, K.Y. ; Moon, J.T. ; Choi, J.S. ; Park, J.W. ; Lee, J.G.
Author_Institution :
Technology Development, Memory Device Business, Samsung Electronics Co., San #24, Nongseo-Lee, Kiheung-Eup, Yongin-Gun, Kyungki-Do, Korea