DocumentCode :
2578810
Title :
Comparative study of charge transport in Si and Ge nanowires
Author :
Verma, A. ; Buin, A.K. ; Anantram, M.P.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Texas A&M Univ. - Kingsville, Kingsville, TX, USA
fYear :
2009
fDate :
2-5 June 2009
Firstpage :
64
Lastpage :
67
Abstract :
We report on detailed calculations of charge mobility in small diameter Ge nanowires, and a comparison with equivalent diameter Si nanowires. The basis for the calculations is provided by band structure calculations within a sp3d5s* tight-binding scheme. Charge-phonon scattering rates are evaluated using Fermi´s golden rule. Mobility calculations are performed using multi-subband momentum relaxation time approximation. In addition, high-field charge transport is also compared among the two classes of materials. High-field transport results are evaluated using ensemble Monte Carlo simulation. High-field transport behavior is found to be qualitatively similar between Si and Ge nanowires, while low-field mobility results show interesting behavior when compared to bulk Si and Ge. Besides providing a comparative analysis of the behavior of these materials, our work also helps to place an upper bound on their expected electronic response.
Keywords :
Monte Carlo methods; band structure; carrier mobility; elemental semiconductors; germanium; nanowires; semiconductor quantum wires; silicon; tight-binding calculations; Fermi golden rule; Ge; Monte Carlo simulation; Si; band structure; charge mobility; charge phonon scattering rates; charge transport; germanium nanowires; multisubband momentum relaxation time; silicon nanowires; tight binding scheme; Acoustic scattering; Acoustic waves; Atom optics; Atomic measurements; Charge carrier processes; Nanotechnology; Nanowires; Optical scattering; Phonons; USA Councils; Germanium nanowires; ensemble Monte Carlo; high-field transport; low-field mobility; silicon nanowires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2009. NMDC '09. IEEE
Conference_Location :
Traverse City, MI
Print_ISBN :
978-1-4244-4695-7
Electronic_ISBN :
978-1-4244-4696-4
Type :
conf
DOI :
10.1109/NMDC.2009.5167559
Filename :
5167559
Link To Document :
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