Characterization of electron surface scattering in single crystalline metallic nanowires

Author

Huang, Qiaojian ; Lilley, Carmen M. ; Bode, Matthias

Author_Institution

Univ. of Illinois at Chicago, Chicago, IL, USA

fYear

2009

fDate

2-5 June 2009

Firstpage

61

Lastpage

63

Abstract

The research presented in this paper is on the modeling and characterization of electrical resistivity for single crystalline silver nanowires. Silver nanowires were self-assembled on vicinal silicon in a high-vacuum environment with high purity metal sources. These wires are atomically smooth and have little to no contaminants. Current-voltage curves were measured in direct contact using a four-point probe measurement within the high vacuum environment.

Keywords

electrical resistivity; electron-surface impact; nanowires; silver; Ag; current-voltage curves; electrical resistivity; electron surface scattering; four-point probe measurement; high purity metal sources; high vacuum environment; self-assembly; single crystalline metallic nanowires; Crystallization; Current measurement; Electric resistance; Electrons; Nanowires; Pollution measurement; Scattering; Self-assembly; Silicon; Silver; Electrical resistivity; electron surface scattering; metallic nanowires; single crystalline nanowires;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology Materials and Devices Conference, 2009. NMDC '09. IEEE

Conference_Location

Traverse City, MI

Print_ISBN

978-1-4244-4695-7

Electronic_ISBN

978-1-4244-4696-4

Type

conf

DOI

10.1109/NMDC.2009.5167569

Filename

5167569