Title :
Frequency stability of 1×10-13 in a compensated sapphire oscillator operating above 77 K
Author :
Santiago, David G. ; Dick, G. John ; Wang, Rabi T.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We report on tests of a frequency-stable temperature compensated sapphire oscillator (CSO) at temperatures above 77 K. Previously, high stability in sapphire oscillators had only been obtained with liquid helium cooling. Recent improvements include a more careful analysis of the ac frequency-lock “Pound” circuitry that now enables the oscillator to reliably attain a stability 6 million times better than its fractional resonator linewidth. The frequency stability of the current resonator with a quality factor of Q≈2×106 is approximately the same as for the very best available quartz oscillators. The apparent CSO flicker floor is 7.5×10-14 for measuring times between 3 and 10 seconds, with stability better than 2×10-13 for all measuring times between 1 and 100 seconds. We project a stability of 2η10-14 for a resonator Q of 107, a value about one third of the intrinsic sapphire Q at this temperature
Keywords :
Q-factor; circuit stability; compensation; cryogenic electronics; crystal oscillators; frequency stability; sapphire; 77 to 87 K; Al2O3; compensated sapphire oscillator; frequency stability; frequency-stable oscillator; quality factor; sapphire resonator; temperature compensated oscillator; Circuit stability; Copper; Frequency; Laboratories; Local oscillators; Propulsion; Q factor; Q measurement; Temperature; Thermal expansion;
Conference_Titel :
Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-3309-8
DOI :
10.1109/FREQ.1996.560254