DocumentCode :
2579373
Title :
Thermal fatigue resistance evaluation of solder joints in IGBT power modules for traction applications
Author :
Thébaud, J.M. ; Woirgard, E. ; Zardini, C. ; Sommer, K.-H.
Author_Institution :
Bordeaux I Univ., Talence, France
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1285
Abstract :
Several ageing test campaigns have been carried out to evaluate thermal fatigue resistance of solder alloys used in IGBT power modules. The solder joint between the ceramic substrate and the copper baseplate of this stack packaging has been the focus of these experiments. Indeed, this interconnection layer is highly subject to shear strains and stresses due to the mismatched expansion on either side of the solder joint during operation. The impact of the substrate metallization and of the cooling rate has been evaluated by measuring crack growth rate on cross sections of cycled solder joints. Two solder alloy compositions have been selected: a lead-free one and a lead-bearing one. Scanning electronic microscopy analyses have allowed a study of cracking at the microstructural level. Moreover, additional analyses based on scanning acoustic microscopy have led to a ranking of the batches under test. Best results in terms of thermal fatigue resistance have been obtained with the lead-bearing solder alloy. Furthermore, it has been shown that the use of bare copper substrates, and above, all fast cooling rate after the solder reflow, delay solder joint failure
Keywords :
acoustic microscopy; ageing; crack detection; insulated gate bipolar transistors; modules; power convertors; reflow soldering; scanning electron microscopy; thermal stress cracking; traction; IGBT power modules; ageing test; bare copper substrates; ceramic substrate; cooling rate; copper baseplate; crack growth rate measurement; cycled solder joints; fast cooling rate; interconnection layer; lead-bearing solder alloy composition; lead-free solder alloy composition; microstructural level cracking analysis; scanning acoustic microscopy; scanning electronic microscopy; shear strains; shear stresses; solder alloys; solder joint failure; solder joints; solder reflow; stack packaging; substrate metallization; thermal fatigue resistance evaluation; traction; Aging; Copper; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Fatigue; Insulated gate bipolar transistors; Lead; Soldering; Testing; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 2000. PESC 00. 2000 IEEE 31st Annual
Conference_Location :
Galway
ISSN :
0275-9306
Print_ISBN :
0-7803-5692-6
Type :
conf
DOI :
10.1109/PESC.2000.880495
Filename :
880495
Link To Document :
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