Title :
Physical Model For Contact Degradation At High Current Densities
Author :
Neugroschel, A. ; Chih-Tang Sah
Author_Institution :
Department of Electrical and Computer Engineering University of Florida, Gainesville, Florida 32611-6200, USA
Conference_Titel :
VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on
Print_ISBN :
4-930813-75-1
DOI :
10.1109/VLSIT.1997.623685
