• DocumentCode
    2579378
  • Title

    Physical Model For Contact Degradation At High Current Densities

  • Author

    Neugroschel, A. ; Chih-Tang Sah

  • Author_Institution
    Department of Electrical and Computer Engineering University of Florida, Gainesville, Florida 32611-6200, USA
  • fYear
    1997
  • fDate
    10-12 June 1997
  • Firstpage
    41
  • Lastpage
    42
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on
  • Print_ISBN
    4-930813-75-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.1997.623685
  • Filename
    623685
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2579378