Title :
Preliminary experimental evaluation on PT-IGBT in parallel connection
Author :
Selgi, Lorenzo M. ; Sorrentino, Giuseppe ; Fragapane, Leonardo ; Melito, Maurizio
Author_Institution :
STMicroelectronics Stradale Primosole, Catania
Abstract :
This paper presents the problems associated with the parallel connection of punch through IGBTs, such as: thermal stability and current balance. An experimental investigation is conducted in the simplest case of two IGBT working in hard switching on an inductive load; a thermal analysis was performed by means of an infrared camera.
Keywords :
insulated gate bipolar transistors; power semiconductor switches; thermal analysis; PT IGBT; current balance; hard switching; infrared camera; parallel connection; punch through IGBT; thermal analysis; thermal stability; Heat sinks; Insulated gate bipolar transistors; MOSFET circuits; Negative feedback; Switches; Temperature; Thermal conductivity; Thermal stability; Uniform resource locators; Voltage; IGBT; Parallel operation;
Conference_Titel :
Power Electronics and Applications, 2007 European Conference on
Conference_Location :
Aalborg
Print_ISBN :
978-92-75815-10-8
Electronic_ISBN :
978-92-75815-10-8
DOI :
10.1109/EPE.2007.4417270
