DocumentCode :
2579565
Title :
Evaluating the effects of cache redundancy on profit
Author :
Das, Abhishek ; Ozisikyilmaz, Berkin ; Ozdemir, Serkan ; Memik, Gokhan ; Zambreno, Joseph ; Choudhary, Alok
Author_Institution :
Electr. Eng. & Comput. Sci. Dept., Northwestern Univ., Evanston, IL
fYear :
2008
fDate :
8-12 Nov. 2008
Firstpage :
388
Lastpage :
398
Abstract :
Previous works in computer architecture have mostly neglected revenue and/or profit, key factors driving any design decision. In this paper, we evaluate architectural techniques to optimize for revenue/profit. The continual trend of technology scaling and sub-wavelength lithography has caused transistor feature sizes to shrink into the nanoscale range. As a result, the effects of process variations on critical path delay and chip yields have amplified. A common concept to remedy the effects of variations is speed-binning, by which chips from a single batch are rated by a discrete range of frequencies and sold at different prices. An efficient binning distribution thus decides the profitability of the chip manufacturer. We propose and evaluate a cache-redundancy scheme called substitute cache, which allows the chip manufacturers to modify the number of chips in different bins. Particularly, this technique introduces a small fully associative array associated with each cache way to replicate the data elements that will be stored in the high latency lines, and hence can be effectively used to boost up the overall chip yield and also shift the chip binning distribution towards higher frequencies. We also develop models based on linear regression and neural networks to accurately estimate the chip prices from their architectural configurations. Using these estimation models, we find that our substitute cache scheme can potentially increase the revenue for the batch of chips by as much as 13.1%.
Keywords :
cache storage; architectural techniques; binning distribution; cache redundancy effects; cache-redundancy scheme; chip manufacturer; computer architecture; linear regression; neural networks; substitute cache; subwavelength lithography; transistor feature sizes; Computer architecture; Costs; Delay effects; Design engineering; Design optimization; Frequency; Lithography; Manufacturing; Profitability; Transistors; Cache Architecture; Device Variability; Fault-tolerance; Process Variations; Profit and Revenue;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microarchitecture, 2008. MICRO-41. 2008 41st IEEE/ACM International Symposium on
Conference_Location :
Lake Como
ISSN :
1072-4451
Print_ISBN :
978-1-4244-2836-6
Electronic_ISBN :
1072-4451
Type :
conf
DOI :
10.1109/MICRO.2008.4771807
Filename :
4771807
Link To Document :
بازگشت