Title :
Dual feedback low noise amplifier for ultra wideband application
Author :
Balashov, Evgeniy V. ; Korotkov, Alexander S.
Author_Institution :
Electr. Eng. & Telecommun. Dept., St. Petersburg Polytech. Univ., St. Petersburg, Russia
Abstract :
In this paper the new type of UWB LNA is presented. The amplifier has a novel feedback topology and load circuit that allows the designer to obtain high voltage gain and matching in the wide frequency range from 3.1 GHz to 10.6 GHz without cascading, current reuse technique and without an additional matching circuit. The key point of the amplifier is the source degeneration with resistive shunt series feedback and the load circuit based on combined parallel-series resonance circuit. The voltage gain of the amplifier is 11 dB, the matching is better than -10 dB, the noise figure lies between 3.2 and 4 dB in the whole frequency range. The value of CP1dB is -15 dB at the frequency near the amplitude response maximum 7.6 GHz. The amplifier consumes the power of 11.5 mW from the voltage supply 1.8 V. These characteristics are obtained by simulation of the amplifier using Virtuoso custom design platform, Cadence design systems, using 0.18 mum CMOS parameters.
Keywords :
CMOS integrated circuits; feedback amplifiers; low noise amplifiers; microwave amplifiers; ultra wideband technology; CMOS parameters; Cadence design systems; UWB LNA; amplitude response; current reuse technique; dual feedback low noise amplifier; feedback topology; frequency 3.1 GHz to 10.6 GHz; gain 11 dB; load circuit; matching circuit; noise figure 3.2 dB; noise figure 4 dB; parallel-series resonance circuit; power 11.5 mW; resistive shunt series feedback; size 0.18 mum; ultra wideband application; voltage 1.8 V; voltage gain; Broadband amplifiers; Circuit noise; Circuit topology; Feedback circuits; Frequency; Low-noise amplifiers; Power amplifiers; RLC circuits; Ultra wideband technology; Voltage; CMOS; low-noise amplifier (LNA); ultra-wideband (UWB);
Conference_Titel :
EUROCON 2009, EUROCON '09. IEEE
Conference_Location :
St.-Petersburg
Print_ISBN :
978-1-4244-3860-0
Electronic_ISBN :
978-1-4244-3861-7
DOI :
10.1109/EURCON.2009.5167628
