Title :
Study of the short-circuit behavior of homogeneous IGBTs using experimental results and a physics based SPICE-model
Author :
Cotorogea, M. ; Claudio, A. ; Aguayo, J.
Author_Institution :
Centro Nacional de Invest. y Desarrollo Tecnologico, Interior Internado Palmira s/n, Cuernavaca, Mexico
Abstract :
The paper presents a detailed analysis of the external and internal behavior of homogeneous IGBTs under different short circuit cases. The study includes experimental results obtained with a specially designed test circuit as well as SPICE simulations performed using a physics based IGBT model
Keywords :
SPICE; insulated gate bipolar transistors; semiconductor device testing; short-circuit currents; SPICE simulations; external behavior; homogeneous IGBT; internal behavior; physics based SPICE-model; short-circuit behavior; test circuit; Circuit faults; Circuit simulation; Circuit testing; Inductance; Insulated gate bipolar transistors; Performance analysis; Physics; Stress; Threshold voltage; Voltage control;
Conference_Titel :
Power Electronics Specialists Conference, 2000. PESC 00. 2000 IEEE 31st Annual
Conference_Location :
Galway
Print_ISBN :
0-7803-5692-6
DOI :
10.1109/PESC.2000.880542
