• DocumentCode
    2580071
  • Title

    GaAs MESFET and Si CMOS cointegration and circuit techniques

  • Author

    Shichijo, H. ; Taddiken, A.H. ; Matyi, R.J.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1988
  • fDate
    6-9 Nov. 1988
  • Firstpage
    239
  • Lastpage
    242
  • Abstract
    The cointegration of GaAs MESFET and Si CMOS circuits on a single chip has recently been achieved using GaAs-on-Si epitaxial growth techniques. The authors discuss the device and circuit aspects of GaAs/Si cointegration and describe some circuit techniques for monolithically interfacing between GaAs MESFET and Si CMOS circuits. The cointegration was realized in a planar structure appropriate for IC (integrated circuit) processing, which allows interconnection of the two types of circuits by conventional metal interconnects. Specifically, the process was demonstrated by fabricating composite ring oscillators consisting of GaAs MESFET BFL (buffered FET logic) inverters and Si CMOS inverters connected in a ring.<>
  • Keywords
    CMOS integrated circuits; III-V semiconductors; Schottky gate field effect transistors; field effect integrated circuits; integrated logic circuits; BFL; CMOS; GaAs; MESFET; Si; buffered FET logic; circuit techniques; cointegration; composite ring oscillators; conventional metal interconnects; epitaxial growth techniques; inverters; monolithically interfacing; planar structure; CMOS process; CMOS technology; Costs; Etching; Fabrication; Gallium arsenide; Integrated circuit interconnections; Laboratories; MESFET circuits; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1988. Technical Digest 1988., 10th Annual IEEE
  • Conference_Location
    Nashville, Tennessee, USA
  • Type

    conf

  • DOI
    10.1109/GAAS.1988.11066
  • Filename
    11066