Title :
A remote operation system for the 3MV electron microscope with a both-direction conversation capability
Author :
Mori, Hirotaro ; Yoshida, Kiyokazu ; Shimojo, Shinji ; Nagawa, H. ; Akiyama, Toyokazu ; Takahash, Heishichiro ; Shibayama, Tamaki
Author_Institution :
Res. Center for Ultra-high Voltage Electron Microscopy, Osaka Univ., Japan
Abstract :
The 3MV ultrahigh voltage electron microscope (UHVEM) at the Research Center for UHVEM, Osaka University, has been widely used for microscopy of thick specimens, taking advantage of high penetration power of incident electrons. Recent developments in advanced networks have enabled us to construct a remote operation system that permits real time operation of the UHVEM. A new function of a both-direction conversation capability is developed and successfully incorporated into the current remote operation system for the 3MV electron microscope. With this improvement, the telemicroscopy with the UHVEM has become more user-friendly.
Keywords :
electron microscopes; high-voltage techniques; real-time systems; remote consoles; 3MV electron microscope; 3MV ultrahigh voltage electron microscope; both-direction conversation capability; high penetration power; incident electrons; real time operation; remote operation system; telemicroscopy; thick specimens microscopy; Electron microscopy; Image communication; Image converters; Layout; Microcomputers; Operating systems; Real time systems; Remote laboratories; Signal generators; Voltage;
Conference_Titel :
Applications and the Internet Workshops, 2004. SAINT 2004 Workshops. 2004 International Symposium on
Print_ISBN :
0-7695-2050-2
DOI :
10.1109/SAINTW.2004.1268695
