Title :
Comparison of lumped-element and transmission-line models for thickness-shear-mode quartz resonator sensors
Author :
Cernosek, R.W. ; Martin, S.J. ; Hillman, A.R. ; Bandey, H.L.
Author_Institution :
Microsensor Res. & Dev. Dept., Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Both a transmission-line model and its simpler variant, a lumped-element model, can be used to predict the responses of a thickness-shear-mode quartz resonator sensor. Relative deviations in the parameters computed by the two models (shifts in resonant frequency and motional resistance) do not exceed 3% for most practical sensor configurations operating at the fundamental resonance. If the ratio of the load surface mechanical impedance to the quartz shear characteristic impedance does not exceed 0.1, the lumped-element model always predicts responses within 1% of those for the transmission-line model
Keywords :
chemical sensors; crystal resonators; electric sensing devices; transmission line theory; viscoelasticity; liquid loading; load surface mechanical impedance; lumped-element and transmission-line models; lumped-element model; mass loading; motional resistance; quartz shear characteristic impedance; surface mechanical impedance; thickness-shear-mode quartz resonator sensors; transmission-line models; viscoelastic layers; Chemical sensors; Electrical resistance measurement; Mechanical sensors; Predictive models; Resonance; Resonant frequency; Sensor phenomena and characterization; Surface impedance; Surface resistance; Transmission lines;
Conference_Titel :
Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3728-X
DOI :
10.1109/FREQ.1997.638526
