• DocumentCode
    2580510
  • Title

    An overview of error control codes for data storage

  • Author

    Benjauthrit, Boonsieng ; Coady, Larry ; Trcka, Milan

  • Author_Institution
    Datatape Inc., Monrovia, CA, USA
  • fYear
    1996
  • fDate
    24-26 Jun 1996
  • Firstpage
    120
  • Lastpage
    126
  • Abstract
    Early work on error control codes (ECC) began with technologists, mostly mathematicians, utilizing algorithms for simple applications. As circuit technology became more powerful and practical, work on ECC progressed to implement more sophisticated codes. The result is a variety of robust ECC algorithms and implementations. Every commercially available data storage device incorporates ECC designed specifically for its particular media, transport, electronics and operating characteristics. As a result, today´s data storage devices tolerate a broad range of harsh conditions. In this paper, we will discuss the various codes which have been employed in data storage devices; including tape, disks and solid-state recorders. We will then describe DATATAPE´s new approach to implementing Reed-Solomon (RS) algorithms into programmable devices to achieve flexibility in ECC capability. The algorithms involved will be a function of media and operational characteristics. The goal is to achieve high speed, low cost, configurable RS encoder/decoder devices, easily adapted to fit specific applications
  • Keywords
    Reed-Solomon codes; digital storage; error correction codes; ECC; Reed-Solomon algorithms; configurable RS encoder/decoder devices; data storage; error control codes; harsh conditions; magnetic disks; magnetic tape; operating characteristics; programmable devices; solid-state recorders; Crosstalk; Error correction; Error correction codes; Magnetic heads; Magnetic materials; Magnetic noise; Magnetostriction; Memory; Optical noise; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nonvolatile Memory Technology Conference, 1996., Sixth Biennial IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    0-7803-3510-4
  • Type

    conf

  • DOI
    10.1109/NVMT.1996.534683
  • Filename
    534683