DocumentCode :
2580789
Title :
Design approach of newly developed 3.3kV IGBT modules
Author :
Iura, Shinichi ; Donlon, John F. ; Thal, Eckhard
Author_Institution :
MITSUBISHI Electr., Fukuoka
fYear :
2007
fDate :
2-5 Sept. 2007
Firstpage :
1
Lastpage :
8
Abstract :
High voltage IGBT (HVIGBT) modules with high performance in the areas of low power loss and high reliability are required for high power applications such as traction, large industrial motor drives, and medium voltage converters. Unfortunately, these performances are often in reciprocal relationship. In order to achieve a higher performance with optimized tradeoffs at the 3.3 kV level, a new IGBT and free wheeling diode (FWD) chip set was developed. This paper describes the optimization of the chip design using several simulation tools and Taguchi method experiments to find the most influential design factors and to secure the most robust design.
Keywords :
Taguchi methods; insulated gate bipolar transistors; power bipolar transistors; power semiconductor diodes; FWD chip set; HVIGBT modules; Taguchi methods; free wheeling diode chip set; high voltage IGBT modules; insulated gate bipolar transistors; power bipolar transistors; voltage 3.3 kV; Chip scale packaging; Europe; Insulated gate bipolar transistors; Performance loss; Robustness; Semiconductor diodes; Semiconductor optical amplifiers; Short circuit currents; Uniform resource locators; Voltage; Design; Device characterisation; Free wheel diode (FWD); IGBT; Power semiconductor device; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications, 2007 European Conference on
Conference_Location :
Aalborg
Print_ISBN :
978-92-75815-10-8
Electronic_ISBN :
978-92-75815-10-8
Type :
conf
DOI :
10.1109/EPE.2007.4417346
Filename :
4417346
Link To Document :
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