• DocumentCode
    2581138
  • Title

    A fingerprint pattern classification approach based on the coordinate geometry of singularities

  • Author

    Msiza, Ishmael S. ; Leke-Betechuoh, Brain ; Nelwamondo, Fulufhelo V. ; Msimang, Ntsika

  • Author_Institution
    Biometrics Res. Group, CSIR Modeling & Digital Sci., Johannesburg, South Africa
  • fYear
    2009
  • fDate
    11-14 Oct. 2009
  • Firstpage
    510
  • Lastpage
    517
  • Abstract
    The problem of automatic fingerprint pattern classification (AFPC) has been studied by many fingerprint biometric practitioners. It is an important concept because, in instances where a relatively large database is being queried for the purposes of fingerprint matching, it serves to reduce the duration of the query. The fingerprint classes discussed in this document are the central twins (CT), tented arch (TA), left loop (LL), right loop (RL) and the plain arch (PA). The classification rules employed in this problem involve the use of the coordinate geometry of the detected singular points. Using a confusion matrix to evaluate the performance of the fingerprint classifier, a classification accuracy of 83.5% is obtained on the five-class problem. This performance evaluation is done by making use of fingerprint images from one of the databases of the year 2002 version of the Fingerprint Verification Competition (FVC2002).
  • Keywords
    biometrics (access control); fingerprint identification; image matching; pattern classification; Fingerprint Verification Competition; automatic fingerprint pattern classification; central twins; confusion matrix; coordinate geometry; fingerprint matching; left loop; plain arch; right loop; singular points; tented arch; Biometrics; Brain modeling; Cybernetics; Fingerprint recognition; Geometry; Pattern classification; Pattern matching; Solid modeling; Spatial databases; USA Councils; Biometrics; Class; Core; Delta; Fingerprint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2009. SMC 2009. IEEE International Conference on
  • Conference_Location
    San Antonio, TX
  • ISSN
    1062-922X
  • Print_ISBN
    978-1-4244-2793-2
  • Electronic_ISBN
    1062-922X
  • Type

    conf

  • DOI
    10.1109/ICSMC.2009.5346860
  • Filename
    5346860