DocumentCode
2581165
Title
Low EMI noise techniques of the 6th generation IGBT module
Author
Igarashi, Seiki ; Takubo, Hirofumi ; Kobayashi, Yasuyuki ; Otsuki, Masahito ; Miyasaka, Tadashi
Author_Institution
Fuji Electr. Device Technol. Co., Ltd., Nagano
fYear
2007
fDate
2-5 Sept. 2007
Firstpage
1
Lastpage
8
Abstract
This paper describes the mechanism of radiation EMI noise coming from power electronics and introduces the applied technology of Fuji 6th generation IGBT modules, which have drastically improved the trade-off of radiation EMI noise and power dissipation loss. The application of new packaging technology has achieved a reduction in radiation noise of about -5dB by reducing the radiation noise loop area. New trench gate IGBTs have achieved a reduction in the radiation noise without significantly increasing switching losses. As a result, the total radiation noise is reduced by - 15 dB with the same dissipation losses compared to the conventional IGBT.
Keywords
electromagnetic interference; insulated gate bipolar transistors; packaging; power electronics; Fuji 6th generation IGBT modules; low EMI noise; packaging; power dissipation loss; power electronics; radiation EMI noise; Capacitance; Cooling; Electromagnetic interference; Insulated gate bipolar transistors; Inverters; Noise generators; Noise reduction; Power generation; Rectifiers; Semiconductor device noise; Device application; EMC/EMI; IGBT; Packaging; Power semiconductor device;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Applications, 2007 European Conference on
Conference_Location
Aalborg
Print_ISBN
978-92-75815-10-8
Electronic_ISBN
978-92-75815-10-8
Type
conf
DOI
10.1109/EPE.2007.4417369
Filename
4417369
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