• DocumentCode
    2581165
  • Title

    Low EMI noise techniques of the 6th generation IGBT module

  • Author

    Igarashi, Seiki ; Takubo, Hirofumi ; Kobayashi, Yasuyuki ; Otsuki, Masahito ; Miyasaka, Tadashi

  • Author_Institution
    Fuji Electr. Device Technol. Co., Ltd., Nagano
  • fYear
    2007
  • fDate
    2-5 Sept. 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper describes the mechanism of radiation EMI noise coming from power electronics and introduces the applied technology of Fuji 6th generation IGBT modules, which have drastically improved the trade-off of radiation EMI noise and power dissipation loss. The application of new packaging technology has achieved a reduction in radiation noise of about -5dB by reducing the radiation noise loop area. New trench gate IGBTs have achieved a reduction in the radiation noise without significantly increasing switching losses. As a result, the total radiation noise is reduced by - 15 dB with the same dissipation losses compared to the conventional IGBT.
  • Keywords
    electromagnetic interference; insulated gate bipolar transistors; packaging; power electronics; Fuji 6th generation IGBT modules; low EMI noise; packaging; power dissipation loss; power electronics; radiation EMI noise; Capacitance; Cooling; Electromagnetic interference; Insulated gate bipolar transistors; Inverters; Noise generators; Noise reduction; Power generation; Rectifiers; Semiconductor device noise; Device application; EMC/EMI; IGBT; Packaging; Power semiconductor device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications, 2007 European Conference on
  • Conference_Location
    Aalborg
  • Print_ISBN
    978-92-75815-10-8
  • Electronic_ISBN
    978-92-75815-10-8
  • Type

    conf

  • DOI
    10.1109/EPE.2007.4417369
  • Filename
    4417369