Title :
Low EMI noise techniques of the 6th generation IGBT module
Author :
Igarashi, Seiki ; Takubo, Hirofumi ; Kobayashi, Yasuyuki ; Otsuki, Masahito ; Miyasaka, Tadashi
Author_Institution :
Fuji Electr. Device Technol. Co., Ltd., Nagano
Abstract :
This paper describes the mechanism of radiation EMI noise coming from power electronics and introduces the applied technology of Fuji 6th generation IGBT modules, which have drastically improved the trade-off of radiation EMI noise and power dissipation loss. The application of new packaging technology has achieved a reduction in radiation noise of about -5dB by reducing the radiation noise loop area. New trench gate IGBTs have achieved a reduction in the radiation noise without significantly increasing switching losses. As a result, the total radiation noise is reduced by - 15 dB with the same dissipation losses compared to the conventional IGBT.
Keywords :
electromagnetic interference; insulated gate bipolar transistors; packaging; power electronics; Fuji 6th generation IGBT modules; low EMI noise; packaging; power dissipation loss; power electronics; radiation EMI noise; Capacitance; Cooling; Electromagnetic interference; Insulated gate bipolar transistors; Inverters; Noise generators; Noise reduction; Power generation; Rectifiers; Semiconductor device noise; Device application; EMC/EMI; IGBT; Packaging; Power semiconductor device;
Conference_Titel :
Power Electronics and Applications, 2007 European Conference on
Conference_Location :
Aalborg
Print_ISBN :
978-92-75815-10-8
Electronic_ISBN :
978-92-75815-10-8
DOI :
10.1109/EPE.2007.4417369